Increasing Electrical Brake Force with Capacitance in the High-Speed Range

Electrical Capacitance

Integrated Capacitance Bridge An integrated capacitance bridge for high-resolution, wide temperature range quantum capacitance measurements

An integrated capacitance bridge for high-resolution, wide temperature range quantum capacitance measurements Arash Hazeghi, 2 Joseph A. Sulpizio, 3 Georgi Diankov, David Goldhaber-Gordon, a) and H.S. Philip Wong These authors contributed equally to this work Department of Electrical Engineering, Stanford University Department of Physics, Stanford University Department of Chemistry, Stanford Un...

Ultrafast-ultrafine probing of high-speed electrical waveforms using a scanning force microscope with photoconductive gating

Picosecond photoconductivity in low-temperature-grown GaAs (LT GaAs) has been used to provide temporal resolution both in rigid probes and in scanning force microscope probes. This article reviews the fabrication and use of such probes. 2.5 ps temporal resolution and few microvolts sensitivity are obtained at arbitrary points on circuits with a spatial definition of 100 nm. Rigid probes are tes...

Force-feedback High-speed Atomic Force Microscope

High-speed atomic force microscopy (HSAFM) has enabled researchers to view the nanometer-scale dynamic behavior of individual biological and bio-relevant molecules at a molecular-level resolution under physiologically relevant time scales, which is the realization of a dream in life sciences. These high-speed imaging applications now extend to the cellular/bacterial systems with the use of a sm...

Cantilevered bimorph-based scanner for high speed atomic force microscopy with large scanning range.

A cantilevered bimorph-based resonance-mode scanner for high speed atomic force microscope (AFM) imaging is presented. The free end of the bimorph is used for mounting a sample stage and the other one of that is fixed on the top of a conventional single tube scanner. High speed scanning is realized with the bimorph-based scanner vibrating at resonant frequency driven by a sine wave voltage appl...